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8960 1xEV-DO Online User's Guide
E1966A, E1976A, E6706B
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SETup Subsystem

Last updated: June 30, 2006

Description

The SETup subsystem is used to configure the test set for each measurement. Typical settings include:

  • Multi-Measurement Count, how many measurements will be made each time a measurement is initiated.
  • Trigger Arm, determines if a measurement will make one measurement then return to idle (single), or automatically rearm on completion of a measurement and repeat the process (continuous).
  • Trigger Source, how a measurement is triggered.
  • Trigger Delay, controls the delay time between the trigger and the start of sampling.
  • Measurement Timeout, length of time before a measurement times out.

   
NOTE
Trigger arming for each measurement is controlled in the SETup subsystem. The choices are single or continuous. In most cases, it is a best practice (during remote operation) to use "single" measurement mode. This simplifies the tasks of starting concurrent measurements, using the INIT subsystem commands to determine which measurements are ready to be fetched, then using the FETCh subsystem to obtain results. The command "SETup:CONTinuous:OFF sets all measurements to "single" trigger mode.

   

Syntax Diagrams and Command Descriptions

SETup:CONTinuous
SETup:AFANalyzer (Audio Analyzer)
SETup:CAPPower (Access Probe Power)
SETup:CFDTune (Fast Device Tune) ( only applicable to the lab application or feature-licensed test application )
SETup:CPERror (Packet Error Rate)
SETup:CPOWer (Channel Power)
SETup:CTDPower (TX Dynamic Power)
SETup:CTXSpurious (TX Spurious Emissions)
SETup:DAPower (Digital Average Power)
SETup:DOWQuality (Waveform Quality + Code Domain)
SETup:GAPPower (Graphical Access Probe Power) ( Lab Application Only )
SETup:SAUDio (Swept Audio)
SETup:SMONitor (Spectrum Monitor)
SETup:TROPower (Time Response of Open Loop Power Control)


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