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Waveform Quality + Code Domain Measurement Description
Last Updated: July 23, 2008
How is a Waveform Quality + Code Domain Measurement Made?
Waveform quality is the basic measure of the performance of a CDMA transmitter. Waveform quality provides information on how well the access terminal's signal matches the ideal signal.
The test set's waveform quality measurement is made by sampling (on a slot-by-slot basis) the AT transmitter down-converted input signal, then applying DSP (Digital Signal Processing) techniques to determine the original data input to the access terminal transmitter's Walsh spreading function for each channel. The DSP then generates a representation of what the "ideal" signal would be given the coding and data in use at the time of transmission. The ideal waveform is then compared with the measured waveform to determine the waveform quality.
Code domain power determines the power in each Walsh code of the access terminal's signal. This allows you to determine how the power is distributed in the access terminal's signal.
The test set's code domain measurements are made by decoding each Walsh code in the access terminal's signal using a Walsh code correlation algorithm. This algorithm measures the waveform correlation factor for each Walsh code. Once the channels are decoded, the power in each code channel is determined.
The waveform quality + code domain measurement returns two sets of results: waveform quality results and code domain results. When you initiate the waveform quality + code domain measurement, both sets of results are always determined, you do not need to initiate them individually (saving you measurement time). The measurement triggering occurs on the test set's internal ~26.667 ms frame clock (the measurement always begins at the start of a frame).
Operating Considerations
You must establish an RTAP (
for subtype 0 physical layer
) or RETAP (
for subtype 2 physical layer
) connection prior to making the waveform quality + code domain measurements. For detailed manual procedure, see
Measuring Waveform Quality + Code Domain Power
.
Waveform Quality + Code Domain Measurement Parameters
-
Slots to Measure - Sets the number of contiguous slots that are sampled during the waveform quality + code domain measurement. It can be set to any integer from 1 to 8 slots (
for subtype 0 physical layer
) or 1 to 4 slots (
for subtype 2 and subtype 3 physical layer
). The returned measurement result indicates the average result over the specified slots.
C.S0033 specifications require that all code domain power measurements acquire 1.66... ms (1 slot) of active data for each channel involved in the calculation. Because not all channels are active for an entire slot, code domain measurements often must acquire data for several slots to compile 1.66... ms of active data for the channels under test. For example, for any subtype 0 physical layer code domain tests involving the power in the R-Pilot channel, the measurement must obtain data from 2 slots, since the R-Pilot channel is only active for 7/8 of a slot.
According to the duty cycle of each channel (percentage of active time during a slot) (see
Subtype 0 Reverse Channel Summary
and
Subtype 2 Reverse Channel Summary
respectively), the recommended Slots to Measure settings are thus as follows:
Recommended Slots to Measure Settings
|
C.S0033-A Test |
Description
|
Recommended Slots to Measure Setting |
|
Subtype 0 Physical Layer |
Subtype 2 Physical Layer |
|
4.1.2 Frequency Accuracy
|
|
1 |
1 |
|
4.2.1 Time Reference
|
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1 |
1 |
|
4.2.2 Waveform Quality and Frequency Accuracy
|
|
1 |
1 |
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4.3.7 RRI Channel Output Power |
This test compares the R-RRI Channel power to the R-Pilot Channel power.
|
8 (Because the RRI Channel is only active for 1/8 of a slot and the R-Pilot Channel is only active for 7/8 of a slot, you must set Slots to Measure to at least 8 for this test.)
|
1 (Because both the R-RRI and R-Pilot channels are active for full slot, you can set Slots to Measure to at least 1 for this test.)
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4.3.8.1 DRC Channel Output Power
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This test compares the R-DRC Channel power to the R-Pilot Channel power.
|
2 (Because the DRC Channel is active for full slot and the R-Pilot Channel is only active for 7/8 of a slot, you must set Slots to Measure to at least 2 for this test.) |
1 (Because both the DRC and R-Pilot channels are active for full slot, you can set Slots to Measure to at least 1 for this test.) |
|
4.3.8.2 ACK Channel Output Power
|
This test compares the R-ACK Channel power to the R-Pilot Channel power.
|
2 (Because the R-ACK Channel is only active for 1/2 of a slot and the R-Pilot Channel is only active for 7/8 of a slot, you must set Slots to Measure to at least 2 for this test.) |
2 (Because the R-ACK Channel is only active for 1/2 of a slot and the R-Pilot Channel is active for full slot, you must set Slots to Measure to at least 2 for this test.) |
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4.3.8.3 Data Channel Output Power
(Tests 1-4, 6-10)
|
These tests compare the R-Data Channel power to the R-Pilot Channel power.
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2 (Because the R-Data channel is active for full slot and the R-Pilot Channel is only active for 7/8 of a slot, you must set Slots to Measure to at least 2 for these tests.)
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1 (Because Both the R-Data and R-Pilot channels are active for full slot, you can set Slots to Measure to at least 1 for these tests.)
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4.3.8.4 DSC Channel Output Power
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This test compares the R-DSC Channel power to the R-Pilot Channel power.
|
Not applicable |
2 (Because the R-DSC Channel is only active for 1/2 of a slot and the R-Pilot Channel is active for full slot, you must set Slots to Measure to at least 2 for this test.) |
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4.3.8.3 Data Channel Output Power
(Test 5)
|
This test compares the inactive channel power to the total power. |
1 (This test measures the power in the inactive channels relative to total power. There is no comparison to R-Pilot power, so Slots to Measure can be set to 1 for this test.) |
1 (This test measures the power in the inactive channels relative to total power.) |
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Multi-Measurement Count - Sets the number of times the measurement will be performed. Each measurement begins on the next available frame boundary (it must wait for the previous measurement to complete, then it begins on the next available frame boundary). When all of the measurements have been performed, the average, minimum, maximum and standard deviation of the results are returned for waveform quality (standard deviation is only available programmatically), only average result is returned for code domain.
For example, if Slots to Measure is set to two and Multi-Measurement Count is set to four:
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Two contiguous slots are measured and averaged
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On the next available frame boundary, two contiguous slots are measured and averaged.
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On the next available frame boundary, two contiguous slots are measured and averaged.
-
On the next available frame boundary, two contiguous slots are measured and averaged.
-
The results of steps 1-4 are averaged and reported.
(See
Statistical Measurement Results
).
-
Ack Channel Gain - (see
ACK Channel Gain
)
-
DRC Channel Gain - (see
DRC Channel Gain
)
-
DSC Channel Gain (
only available for subtype 2 physical layer
) - (see
DSC Channel Gain
)
-
Graphical Waveform Quality State
On - When the Graphical Waveform Quality State is set to On, the softkey Graphical Waveform Quality is available and displayed to give a graphical or numerical view of
Chip EVM Graphical Display
,
IQ Constellation Graphical Display
, and
Waveform Quality Numerical Display
.
Off - When the Graphical Waveform Quality State is set to Off, the softkey Graphical Waveform Quality will not be available and displayed, and the
FETCh:DOWQuality:EVM:TRACe?
will return 9.91E37 (NAN). The default value of Graphical Waveform Quality State is Off.
When the current view is Graphical Waveform Quality, setting the Graphical Waveform Quality State to OFF will cause the view change to Numeric Rho by force.
-
Trigger Arm - (see
Trigger Arm (Single or Continuous) Description
).
-
Timeout Time/State - (see
Measurement Timeouts
).
Both the Slots to Measure and Multi-Measurement Count are not applicable to the graphical Waveform Quality measurement. When Slots to Measure is greater than 1 and Multi-Measurement Count is set to on, only the Chip EVM or IQ Constellation measurement results for the last slot during the last measurement will be returned.
Waveform Quality + Code Domain Measurement Results
Waveform Quality Measurement Results
The waveform quality (numeric rho) measurement returns:
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