Last updated: January 15, 2009
TX Spurious Emissions is a measure of the access terminal's transmission at frequencies outside its assigned channel.
When performing with a single test set, the TX Spurious Emissions measurement is made by first making a channel power measurement centered on the assigned channel, to determine carrier power. The test set then measures the power at four frequencies offset from the center of the assigned channel. The test set measures the average power present at each frequency offset, over a slot, within a 30 kHz filter centered on the offset frequency. The test set then reports the power of each frequency offset relative to the carrier power (the result is given in dBc).
The four frequency offsets at which power is measured depends upon the AT band class:
The measurement triggers on the test set's internal ~1.667 ms slot clock.
You must establish an RTAP (for Subtype 0 Physical Layer) or RETAP (for Subtype 2 Physical Layer) connection to perform the TX spurious emissions measurement (see Measuring TX Spurious Emissions for detailed procedure).
When performing with multiple test sets with Multi-carrier Multi-unit (MCMU) configuration and multiple carrier, according to the standard C.S0033-B, 3 tests can be used to perform the TX spurious emissions measurement: Test 1, Test 2 and Test 3.
According to the carrier separation, there are two test cases for this test: the first test case is for the AT to transmit the two carriers with equal or more than the maximum possible frequency separation (the maximum possible frequency separation is 4x1.23MHz for band class 0 and 4x1.25MHz for the other band classes), and the other test case is for the two carriers with less than the maximum possible frequency separation.
For the first test case, the Tx Spurious measurement is made on each test set for the carrier the test set is receiving, the four emission powers with the frequency offsets are measured. See An example graphical result for test case 1 of Test 2 on the two test sets .
For the second test case, the Tx Spurious measurement is made on each test set at the fixed offsets outside the two carriers, but the emission powers between the two carriers are never measured. See An example graphical result for test case 2 of Test 2 on the two test sets .
The adjacent offsets are fixed at ± 2.5 MHz at each side of the middle reverse channel, the alternate offsets could be set from ± 2.7 MHz to ± 3.47 MHz and the second alternate offsets could be set from ± 3.5 to ± 6.5 MHz with the alternate limit or second alternate limit changing with the offset when the
Mask Control
is set to
Auto
.
You must establish an RMCTAP (for Subtype 3 Physical Layer) connection to perform the TX spurious emissions measurement with multi-carrier multi-unit (see Measuring TX Spurious Emissions for detailed procedure).
Selects the test case that will be used when performing
TX Spurious Emissions measurement with multi-carrier multi-unit
. It is only available when the
Protocol Rel
is set to
B(1xEV-DO-B)
and the
Release B Physical Layer Subtype
is set to
Subtype 3
(See
Protocol Rel
or
Release B Physical Layer Subtype
).
When set to auto, the pass/fail limits for the spurious emissions at the adjacent and alternate channels are set as specified by C.S0033 3.1.2.4.1. For the Test 3, the emission powers alternate limit and second alternate limit will be changing with the offset, see Test3 Alternate Offset/Test3 Second Alternate Offset . When set to manual, you can set the pass/fail limits for the measurement. Separate pass/fail limits are provided for the adjacent and alternate channel measurements.
Sets the pass/fail limit for the adjacent channel measurement (range is -65 to -10 dBc).
Sets the pass/fail limit for the alternate channel measurement (range is -65 to -10 dBc).
Sets the pass/fail limit for the adjacent channel measurement when the
Test Case Setup
is set to Test X (where X refers to 1, 2 or 3) and the
Mask Control
is set to
Manual
.
Sets the pass/fail limit for the alternate channel measurement when the
Test Case Setup
is set to Test X (where X refers to 1, 2 or 3) and the
Mask Control
is set to
Manual
.
Sets the pass/fail limit for the second alternate channel measurement when the
Test Case Setup
is set to
Test 3
and the
Mask Control
is set to
Manual
.
Sets the alternate offset or the second alternate offset of the test 3.
The TX Spurious Emissions measurement screen can display numeric results or a graphical display.
The TX spurious emissions measurement is automatically calibrated during a channel power calibration. Follow the channel power calibration schedule and the TX spurious emissions measurement will be properly calibrated. Refer to Calibrating the Test Set for a description of channel power calibration.
GPIB Commands:
Manual Operation: Measuring TX Spurious Emissions
Programming a Tx Spurious Emissions Measurement
Tx Spurious Emissions Measurement Troubleshooting
C.S0029 Test Application Specification Description (TAP/ETAP/MCTAP)